可订购部件
型号 | 可订购的器件编号 | 订购代码(12NC) | 封装 | 从经销商处购买 |
---|---|---|---|---|
74AHCT138BQ-Q100 | 74AHCT138BQ-Q100X | 935300198115 | SOT763-1 | 订单产品 |
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Click here for more information3-to-8 line decoder/demultiplexer; inverting
The 74AHC138-Q100; 74AHCT138-Q100 are high-speed Si-gate CMOS devices and are pin compatible with Low power Schottky TTL (LSTTL). They are specified in compliance with JEDEC standard No. 7A.
The 74AHC138-Q100; 74AHCT138-Q100 is a 3-to-8 line decoder/demultiplexer. It accepts three binary weighted address inputs (A0, A1 and A2) and, when enabled, provides eight mutually exclusive outputs (Y0 to Y7) that are LOW when selected.
There are three enable inputs: two active LOW (E1 and E2) and one active HIGH (E3). Every output will be HIGH unless E1 and E2 are LOW and E3 is HIGH.
This multiple enable function allows easy parallel expansion of the device to a 1-of-32 (5 lines to 32 lines) decoder with just four 74AHC138-Q100; 74AHCT138-Q100 devices and one inverter. The 74AHC138-Q100; 74AHCT138-Q100 can be used as an eight output demultiplexer by using one of the active LOW enable inputs as the data input and the remaining enable inputs as strobes. Unused enable inputs must be permanently tied to their appropriate active HIGH or LOW state.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from -40 °C to +85 °C and from -40 °C to +125 °C
Balanced propagation delays
All inputs have Schmitt-trigger action
Demultiplexing capability
Multiple input enable for easy expansion
Ideal for memory chip select decoding
Inputs accepts voltages higher than VCC
For 74AHC138-Q100 only: operates with CMOS input levels
For 74AHCT138-Q100 only: operates with TTL input levels
ESD protection:
HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V
CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V
Multiple package options
DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints
型号 | VCC (V) | Logic switching levels | Output drive capability (mA) | tpd (ns) | Power dissipation considerations | Tamb (°C) | Package name |
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74AHCT138BQ-Q100 | 4.5 - 5.5 | TTL | ± 8 | 4.4 | low | -40~125 | DHVQFN16 |
Model Name | 描述 |
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型号 | 可订购的器件编号,(订购码(12NC)) | 状态 | 标示 | 封装 | 外形图 | 回流焊/波峰焊 | 包装 |
---|---|---|---|---|---|---|---|
74AHCT138BQ-Q100 | 74AHCT138BQ-Q100X (935300198115) |
Active | AHT138 |
DHVQFN16 (SOT763-1) |
SOT763-1 | SOT763-1_115 |
文件名称 | 标题 | 类型 | 日期 |
---|---|---|---|
74AHC_AHCT138_Q100 | 3-to-8 line decoder/demultiplexer; inverting | Data sheet | 2024-02-29 |
AN11106 | Pin FMEA for AHC/AHCT family | Application note | 2019-01-09 |
SOT763-1 | 3D model for products with SOT763-1 package | Design support | 2019-10-03 |
ahct138 | ahct138 IBIS model | IBIS model | 2013-04-08 |
Nexperia_package_poster | Nexperia package poster | Leaflet | 2020-05-15 |
DHVQFN16_SOT763-1_mk | plastic, dual in-line compatible thermal enhanced very thin quad flat package; 16 terminals; 0.5 mm pitch; 3.5 mm x 2.5 mm x 0.85 mm body | Marcom graphics | 2017-01-28 |
SOT763-1 | plastic, leadless dual in-line compatible thermal enhanced very thin quad flat package; 16 terminals; 0.5 mm pitch; 3.5 mm x 2.5 mm x 1 mm body | Package information | 2023-05-11 |
SOT763-1_115 | DHVQFN16; Reel pack, SMD, 7" Q1/T1 product orientation | Packing information | 2020-04-21 |
74AHCT138BQ-Q100_Nexperia_Product_Reliability | 74AHCT138BQ-Q100 Nexperia Product Reliability | Quality document | 2024-06-16 |
型号 | Orderable part number | Ordering code (12NC) | 状态 | 包装 | Packing Quantity | 在线购买 |
---|---|---|---|---|---|---|
74AHCT138BQ-Q100 | 74AHCT138BQ-Q100X | 935300198115 | Active | SOT763-1_115 | 3,000 | 订单产品 |
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The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.