双极性晶体管

二极管

ESD保护、TVS、滤波和信号调节ESD保护

MOSFET

氮化镓场效应晶体管(GaN FET)

绝缘栅双极晶体管(IGBTs)

模拟和逻辑IC

汽车应用认证产品(AEC-Q100/Q101)

BAV70T

High-speed switching diodes

High-speed switching diode, encapsulated in small Surface-Mounted Device (SMD) plastic packages.

此产品已停产

Features and benefits

  • High switching speed: trr ≤ 4 ns
  • Low capacitance: Cd ≤ 1.5 pF
  • Low leakage current
  • Reverse voltage: VR ≤ 100 V
  • Ultra small SMD plastic package
  • AEC-Q101 qualified

Applications

  • High-speed switching
  • General-purpose switching

参数类型

型号 Package version Package name Size (mm)
BAV70T SOT416 SC-75 1.6 x 0.75 x 0.9

封装

下表中的所有产品型号均已停产 。

型号 可订购的器件编号,(订购码(12NC)) 状态 标示 封装 外形图 回流焊/波峰焊 包装
BAV70T BAV70T,115
(934054727115)
Obsolete SOT416
SC-75
(SOT416)
SOT416 SOT416_115
BAV70T,145
(934054727145)
Obsolete 暂无信息
BAV70T,185
(934054727185)
Obsolete 暂无信息
BAV70T/G,115
(934058356115)
Obsolete SOT416_115
BAV70T/DG,115
(934061911115)
Obsolete SOT416_115

环境信息

下表中的所有产品型号均已停产 。

型号 可订购的器件编号 化学成分 RoHS RHF指示符
BAV70T BAV70T,115 BAV70T rohs rhf rhf
BAV70T BAV70T,145 BAV70T rohs rhf rhf
BAV70T BAV70T,185 BAV70T rohs rhf rhf
BAV70T BAV70T/G,115 BAV70T rohs rhf rhf
BAV70T BAV70T/DG,115 BAV70T rohs rhf rhf
品质及可靠性免责声明

文档 (5)

文件名称 标题 类型 日期
BAV70_SER High-speed switching diodes Data sheet 2022-07-01
Nexperia_package_poster Nexperia package poster Leaflet 2020-05-15
LSYMDIO Letter Symbols - Diodes General Other type 1999-04-30
SOT416 plastic, surface-mounted package; 3 leads; 1 mm pitch; 1.6 mm x 0.75 mm x 0.9 mm body Package information 2020-04-21
BAV70T BAV70T SPICE model SPICE model 2012-07-22

支持

如果您需要设计/技术支持,请告知我们并填写 应答表 我们会尽快回复您。

模型

文件名称 标题 类型 日期
BAV70T BAV70T SPICE model SPICE model 2012-07-22

How does it work?

The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.