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Click here for more information74HCT2G125GD
Dual buffer/line driver; 3-state
The 74HC2G125; 74HC2G125 are dual buffer/line drivers with 3-state outputs controlled by the output enable inputs (nOE). Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.
Alternatives
Features and benefits
Wide supply voltage range from 2.0 V to 6.0 V
Input levels:
For 74HC2G125: CMOS level
For 74HCT2G125: TTL level
CMOS low power dissipation
High noise immunity
Latch-up performance exceeds 100 mA per JESD 78 Class II Level B
Complies with JEDEC standard: JESD7A (4.5 V to 5.5 V)
ESD protection:
HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V
CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V
Specified from -40 °C to +85 °C and -40 °C to +125 °C
参数类型
型号 | Package name |
---|---|
74HCT2G125GD | XSON8 |
封装
下表中的所有产品型号均已停产 。
型号 | 可订购的器件编号,(订购码(12NC)) | 状态 | 标示 | 封装 | 外形图 | 回流焊/波峰焊 | 包装 |
---|---|---|---|---|---|---|---|
74HCT2G125GD | 74HCT2G125GD,125 (935287333125) |
Obsolete | T25 |
XSON8 (SOT996-2) |
SOT996-2 | SOT996-2_125 |
文档 (5)
文件名称 | 标题 | 类型 | 日期 |
---|---|---|---|
74HC_HCT2G125 | Dual buffer/line driver; 3-state | Data sheet | 2023-11-16 |
AN11044 | Pin FMEA 74HC/74HCT family | Application note | 2019-01-09 |
74hct2g125gd | 74hct2g125gd IBIS model | IBIS model | 2013-04-08 |
Nexperia_package_poster | Nexperia package poster | Leaflet | 2020-05-15 |
SOT996-2 | plastic, leadless extremely thin small outline package; 8 terminals; 0.5 mm pitch; 3 mm x 2 mm x 0.5 mm body | Package information | 2020-04-21 |
支持
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模型
文件名称 | 标题 | 类型 | 日期 |
---|---|---|---|
74hct2g125gd | 74hct2g125gd IBIS model | IBIS model | 2013-04-08 |
How does it work?
The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.