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Click here for more information74HC174DB
Hex D-type flip-flop with reset; positive-edge trigger
The 74HC174; 74HCT174 are hex positive edge-triggered D-type flip-flops with individual data inputs (Dn) and outputs (Qn). The common clock (CP) and master reset (MR) inputs load and reset all flip-flops simultaneously. The D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition is stored in the flip-flop and appears at the Q output. A LOW on MR causes the flip-flops and outputs to be reset LOW. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.
Alternatives
Features and benefits
Wide supply voltage range from 2.0 to 6.0 V
CMOS low power dissipation
High noise immunity
Input levels:
For 74HC174: CMOS level
For 74HCT174: TTL level
Six edge-triggered D-type flip-flops
Asynchronous master reset
Complies with JEDEC standards
JESD8C (2.7 V to 3.6 V)
JESD7A (2.0 V to 6.0 V)
Latch-up performance exceeds 100 mA per JESD 78 Class II Level B
ESD protection:
HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V
CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V
Specified from -40 °C to +85 °C and -40 °C to +125 °C.
PCB Symbol, Footprint and 3D Model
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封装
下表中的所有产品型号均已停产 。
型号 | 可订购的器件编号,(订购码(12NC)) | 状态 | 标示 | 封装 | 外形图 | 回流焊/波峰焊 | 包装 |
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74HC174DB | 74HC174DB,112 (935188580112) |
Obsolete | no package information | ||||
74HC174DB,118 (935188580118) |
Obsolete |
Series
文档 (3)
文件名称 | 标题 | 类型 | 日期 |
---|---|---|---|
74HC_HCT174 | Hex D-type flip-flop with reset; positive-edge trigger | Data sheet | 2024-03-14 |
AN11044 | Pin FMEA 74HC/74HCT family | Application note | 2019-01-09 |
HCT_USER_GUIDE | HC/T User Guide | User manual | 1997-10-31 |
支持
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模型
No documents available
PCB Symbol, Footprint and 3D Model
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How does it work?
The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.